לפרטים נוספים ולקבלת הצעת מחיר
Nikon’s NEXIV VMF-K Series transforms optical measurement, combining high-speed 2D and 3D capabilities with exceptional accuracy. Its advanced confocal system boosts throughput for diverse samples, supporting miniaturisation in semiconductor and precision engineering industries.
Next-Level Throughput, Quality and Measurements
Nikon’s NEXIV VMF-K Series enhances traditional measurement systems by employing an advanced confocal optical system. Designed to improve measurement speed, the VMF-K Series allows users to analyse various materials and components with unprecedented efficiency and precision.
The NEXIV VMF-K Series addresses the challenges posed by complex sample geometries — including high-contrast surfaces and transparent materials — enabling users to capture detailed measurements that were previously challenging to obtain. The system’s integrated 2D and 3D measurement capabilities dramatically reduce inspection times compared to traditional methods, allowing for significantly faster and more comprehensive quality control processes.
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